Application of Structured light projection
Structured light projection (SLP) is a non-contact optical metrology method which can measure to the micron scale. The technique involves projecting a known light irradiance pattern onto the surface under test, which then scatters the light creating a 3D image on the surface. The scattered light is recorded by one or more cameras and the scattered pattern is compared to the modeled projected pattern to determine the surface profile. For a test surface to be measurable with the SLP technique, it must be a scattering surface over the spectrum of light that is projected on to it. Typically, visible light is used for a SLP device, as the light sources and projection mechanisms are more straightforward to achieve, although another wavelength can be used when necessary. Figure below demonstrates a projected fringe pattern that was captured by a camera, and the corresponding surface that was calculated. Surface height accuracy The surface height features that are measurable by the SLP techni